Journal of Metals (JOM) 2010 v.62 №12

Volume 62, Issue 12, December 2010
ISSN: 1047-4838 (Print) 1543-1851 (Online)In the final analysis Page 2Out of Iowa: Students learn more than materials engineering in Mali
Lynne Robinson Pages 11-14Small-scale materials behavior from X-ray microdiffraction and imaging
Rozaliya I. Barabash, Gene E. Ice Page 21Characterization of polycrystalline materials using synchrotron X-ray imaging and diffraction techniques
W. Ludwig, A. King, M. Herbig, P. Reischig, J. Marrow, L. Babout, E. M. Lauridsen… Pages 22-28Measuring depth-dependent dislocation densities and Elastic strains in an indented Ni-based Superalloy
O. M. Barabash, M. Santella, R. I. Barabash, G. E. Ice, J. Tischler Pages 29-34The use of Laue microdiffraction to study small-scale plasticity
H. Van Swygenhoven, S. Van Petegem Pages 36-43Rrevealing plastic deformation mechanisms in polycrystalline thin films with synchrotron XRD
Ralph D. Nyilas, Stephan Frank, Ralph Spolenak Pages 44-51Solid State interfaces: Toward an atomistic-scale understanding of structure, properties, and behavior
D. L. Medlin, M. J. Demkowicz, E. A. Marquis Page 52Atomic-scale STEM-EELS mapping across functional interfaces
Christian Colliex, Laura Bocher, Francisco de la Pena, Alexandre Gloter, Katia March… Pages 53-57Nanoanalysis of interfacial chemistry
G. Schmitz, C. Ene, H. Galinski, R. Schlesiger, P. Stender Pages 58-63The use of advanced characterization to study transitions across solid state interfaces
R. Srinivasan, R. Banerjee, G. B. Viswanathan, S. Nag, J. Y. Hwang, J. Tiley… Pages 64-69Behavior of dopant-modified interfaces in metallic nanocrystalline materials
Rahul K. Rajgarhia, Douglas E. Spearot, Ashok Saxena Pages 70-74Interface-enabled defect reduction in He ion irradiated metallic multilayers
X. Zhang, E. G. Fu, A. Misra, M. J. Demkowicz Pages 75-78The characterization of new and next-generation materials
Mingdong Cai, Jiann-Yang Hwang Page 79Physical, chemical and antimicrobial characterization of copper-bearing material
Bowen Li, Jiann-Yang Hwang, Jaroslaw Drelich, Domenic Popko, Susan Bagley Pages 80-85Characterization and analysis of Porous, Brittle solid structures by X-ray micro computed tomography
C. L. Lin, A. R. Videla, Q. Yu, J. D. Miller Pages 86-89Materials applications of photoelectron emission microscopy
G. Xiong, R. Shao, S. J. Peppernick, A. G. Joly, K. M. Beck, W. P. Hess, M. Cai… Pages 90-93Solar-grade silicon production by metallothermic reduction
Kouji Yasuda, Toru H. Okabe Pages 94-101Characterization of copper nanoparticles synthesized by a novel microbiological method
Ratnika Varshney, Seema Bhadauria, M. S. Gaur, Renu Pasricha Pages 102-104Get involved: Megan Frary, material advantage advisor
Kelly Zappas Page 110